Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements
scientific article
Instance of
Author
Ilme Schlichting
Joachim Ullrich
Artem Rudenko
Heinz Graafsma
Sascha Epp
Benjamin Erk
Andrew V Martin
Michael J. Bogan
Henry N. Chapman
Uwe Weierstall
Richard Kirian
Lukas Lomb
Anton Barty
Thomas A White
Francesco Stellato
Nicusor Timneanu
John D. Bozek
Lutz M Foucar
Cornelia B Wunderer
Linda C Johansson
Joachim Schulz
Miriam Barthelmess
David Arnlund
Erik Malmerberg
Daniel P Deponte
Stefano Marchesini
Andrew Aquila
Robert Shoeman
Stephan Kassemeyer
Daniel Rolles
Benedikt Rudek
Nils Kimmel
Georg Weidenspointner
Mengning Liang
Lars Gumprecht
Tomas Ekeberg
Holger Fleckenstein
Helmut Hirsemann
Karol Nass
Heike Soltau
R Bruce Doak
Sasa Bajt
Carl Caleman
Ryan Coffee
Janos Hajdu
Marvin Seibert
Lothar Strüder
Petra Fromme
Richard Neutze
